We propose and demonstrate a new method for contactless sampling of high-speed electrical signals, by spectral analysis of photoelectrons emitted when a signal-carrying conductor is illuminated by ultrashort light pulses. We present time-resolved measurements of sub-ns electrical signals on a gold transmission line on GaAs using three-photon photoemission induced by 80 fs visible laser pulses, and we discuss the temporal resolution of these measurements. This method is applicable to devices and circuits on any semiconductor.
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Marcus et al. (1986) studied this question.
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