A simple and robust setup for femtosecond time-resolved imaging interferometry of surfaces is described. The apparatus is capable of measuring both very small phase shifts (∼3×10−2 rad) and amplitude changes(∼1%) with micrometer spatial resolution (∼1 μm). Interferograms are processed using a 2D-Fourier transform algorithm. We discuss the image formation and the physical interpretation of the measured interferograms. The technique is applied to measure transient changes of a GaAs surface irradiated with intense femtosecond laser pulses with fluences near the ablation threshold.
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Temnov et al. (2006) studied this question.
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