This article reviews the latest instrumentation used in high resolution nonlinear microscopy and techniques for the temporal and spatial calibration of this instrumentation. This includes an overview of currently available ultrashort laser sources, the dispersion characteristics of microscopes, methods for pulse measurement at high numerical aperture, dispersion compensation techniques, and finally a brief overview of a number of nonlinear imaging methods presently used in these systems.
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Squier et al. (2001) studied this question.
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