A Uniform Eddy Current Probe with a Double-Excitation Coil for Flaw Detection on Aluminium Plates

In this present study, a new uniform eddy current (UEC) probe with a double-excitation coil and pancake orientation is proposed. It is confirmed that the probe generates a strong magnetic field induction that increases the intensity of uniform eddy currents; moreover, it is found to be more efficient in power consumption for excitation using a finite element simulation. Experiments are performed to detect different flaw lengths and depths on an aluminium plate. The flaw signal detected by the probe indicates a high signal-to-noise ratio and increases as a function of flaw depth. The quantitative evaluation of flaws with the proposed UEC probe is achieved based on experimental results.