Although it has been shown that cosmic ray neutrons play an important role in soft error (SE) phenomena, some important issues remain to be clarified in neutron-induced SE phenomena. This letter reports the geometric effect of multiple-bit SE's induced by neutrons. Multiple-bit SE's in 16 Mb DRAM's are investigated and their geometric effects on high reliability systems are discussed.
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Satoh et al. (2000) studied this question.
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