Angle calculations for a (2+3)-type diffractometer are presented with comprehensive derivations for both cases of either a vertical or horizontal sample configuration. This work focuses on some particular aspects of using area detectors in surface X-ray diffraction, namely the role of the detector rotation and the direct conversion of the angle-resolved diffraction signal recorded by the detector into a two-dimensional slice through reciprocal space.
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Schlepütz et al. (2010) studied this question.
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