The {110} reflection in X‐ray diffraction of MX ene films: Misinterpretation and measurement via non‐standard orientation

It has been claimed that disappearance of the {110} reflection in powder X‐ray diffraction of MX ene films and powders is indicative of shearing or general disorder of restacking of the flakes. Here we show this to be incorrect and provide experimental justification. The disappearance of this peak arises from a combination of sample texture and orientation. Furthermore, our methods provide a simple way to estimate a unit cell parameters when the relevant reflections are not present in most reports of MX ene films.