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July 1, 1980Philosophical Magazine B

Analysis of field-effect and capacitance–voltage measurements in amorphous semiconductors

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Authors

NGN. B. GoodmanWestern Michigan UniversityHFH. FritzscheUniversity of Chicago

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Goodman et al. (1980) studied this question.

synapsesocial.com/papers/6a7beff484d0f3193c7606edhttps://doi.org/10.1080/01418638008225645
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