Solute Trapping in Silicon by Lateral Motion of {111} Ledges

The orientation dependence of the nonequilibrium partition coefficient of Bi in Si at constant solid-liquid interface velocity has been measured. The partition coefficient, measured with pulsed-laser melting techniques on a series of Si wafers cut at 5^∘{} increments from (110) through (111) to (001), is sharply peaked at (111) and decreases monotonically with increasing inclination from (111). The results suggest that crystal growth and solute trapping occur by the lateral motion of {111} ledges.