Characterisation of an electron collecting CdTe strip sensor using the MYTHEN readout chip

MYTHEN is a single photon counting hybrid strip X-ray detector that has found application in x-ray powder diffraction (XRPD) experiments at synchrotrons worldwide. Originally designed to operate with hole collecting silicon sensors, MYTHEN is suited for detecting X-rays above 5 keV, however many PD beamlines have been designed for energies above 50 keV where silicon sensors have an efficiency of only few percent. In order to adapt MYTHEN to meet these energies the absorption efficiency of the sensor must be substantially increased. Cadmium-Telluride (CdTe) has an absorption efficiency approximately 30 times that of silicon at 50 keV, and is therefore a very promising replacement candidate for silicon. Furthermore, the large dynamic range of the pre-amplifier of MYTHEN and its double polarity capability has enabled the characterisation of an electron collecting Schottky type CdTe sensor. A CdTe MYTHEN system has undergone a series of characterisation experiments including stress test of bias and radiation induced polarizations. The performance of this system will be presented and discussed.