Influence of Bias-Induced Copper Diffusion on the Resistive Switching Characteristics of a SiON Thin Film, Yang, Po-Chun, Chang, Ting-Chang, Chen, Shih-Ching, Lin, Yu-Shih, Huang, Hui-Chun, Gan, Der-Shin
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Yang et al. (2010) studied this question.
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