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The aim of this work is to investigate the electron transport through metal–ferroelectric–metal (MFM) junctions with ultrathin barriers in order to determine its dependence on the polarization state of the barrier. To that end, heteroepitaxial Pt/Pb(Zr0.52Ti0.48)O3/SrRuO3 junctions have been fabricated on lattice-matched SrTiO3 substrates. The current–voltage (I–V) characteristics of the MFM junctions involving a few-nanometer-thick Pb(Zr0.52Ti0.48)O3 barriers have been recorded at temperatures between 4.2 K and 300 K. Typical I–V curves exhibit reproducible switching events at well-defined electric fields. The mechanism of charge transport through ultrathin barriers and the origin of the observed resistive switching effect are discussed.
Contreras et al. (Fri,) studied this question.