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July 1, 1996Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode

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PGPeter GüthnerUniversity of Konstanz

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Peter Güthner (1996) studied this question.

synapsesocial.com/papers/6a7d3c0cc66da78fab8b2a3a https://doi.org/10.1116/1.588873

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