Randomized trial demonstrates effective spectral detection in a compact sensor, suggesting innovative spectral analysis capabilities.
Spectral information, reflecting the interaction between light and matter across different wavelengths, is essential for identifying material properties and environmental changes. To meet the demand for compact spectral sensors, we constructed a type‐I band‐aligned MoTe 2 /Te van der Waals (vdW) heterostructure through precise band structure design, where the drain–source voltage ( V ds ) electrostatically tunes interfacial band alignment to complement gate voltage ( V gs ) modulation. By synergistically tuning the V gs and V ds , we achieved a wavelength‐dependent photoresponse and constructed a spectral responsivity matrix. Integrated with an attention‐guided multilayer perceptron (MLP) algorithm that incorporates the device's responsivity as prior physical information, the device functions as a miniaturized spectrometer, demonstrating narrowband spectral reconstruction with an optimal resolution of 6 nm across a broadband range from 500 to 780 nm at room temperature. The noncentrosymmetric crystal structure of Te also endows the device with the capability of simultaneous polarization discrimination. This work provides a promising approach toward multifunctional on‐chip spectrometers capable of simultaneous spectral and polarization analysis.
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Qin et al. (2026) studied this question.
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