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October 13, 1975Physical Review Letters

Frequency-Dependent Cyclotron Effective Masses in Si Inversion Layers

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Authors

TKT. A. KennedyRutgers, The State University of New JerseyRWR. J. WagnerDeutsches Zentrum für Luft- und Raumfahrt e. V. (DLR)BMB. D. McCombeUniversity at Buffalo, State University of New York

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Kennedy et al. (1975) studied this question.

synapsesocial.com/papers/6a7dbf06286d888403cdaa0fhttps://doi.org/10.1103/physrevlett.35.1031
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  1. 1Cyclotron Resonance in Uniaxially Stressed Silicon. II. Nature of the Covalent Bond1965 · 338 citations
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  4. 4Far-Infrared Cyclotron Resonance in the Inversion Layer of Silicon1974 · 92 citations
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