We grow high-quality epitaxial Fe/Cr/Fe trilayers on Au(001) buffer layers and control the roughness of the Fe/Cr interfaces by stopping the deposition of Fe and Cr at a reflection high-energy electron diffraction (RHEED) intensity maximum or minimum. We thus obtain pairs of identical samples which only differ by their interface roughness as confirmed by X-ray reflectivity. Magneto-optical hysteresis loops reveal perfect antiparallel alignment at low fields for all samples. The current-in-plane giant magnetoresistance (CIP-GMR) of trilayers with rougher interfaces is significantly enhanced.
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Olligs et al. (2002) studied this question.
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