It is important with a resistance type current limiting element to make quench occur uniformly over the whole area of the element. Current limiting experiments were carried out to find out the quench characteristics of some specifications of elements with YBCO thin films. In the experiments, applied voltage, fault duration and short-circuit phase were changed. As a result, uniform or local quench was observed. The films were damaged at about 500 K. Moreover, a current limiting simulation considering the dispersion of critical current was compared with the experimental results. The calculated results agreed with the experimental results.
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Shimohata et al. (2003) studied this question.
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