During the past three decades, ultraviolet photoelectron spectroscopy of polymer films has evolved from a sort of appearance-potential (valence band edge) measurement, into a tool for studying the full valence band region of thin polymer films, including insulating polymers, semiconducting polymers and electrically conducting polymers. Progress may be loosely divided into several categories: (A) the melding of thin polymer film technology with ultra high vacuum technology and the widespread use of helium resonance lamps for studies of solid surfaces; (B) the combined approach of measurements and appropriate theoretical-computational methods; and (C) the advent of synchrotron radiation resulting in multi-photon spectroscopies, nominally in the area of the near UV. A coincident discovery of electrically conducting polymers, and especially the evolution of applications of semiconducting polymers, added technologically driven emphasis to this development of UPS for polymer materials. This contribution traces a limited number of highlights in the evolution of UPS of polymers, from the ‘70's through to 2005.
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Jong et al. (2006) studied this question.
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