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Complete wetting and critical wetting transitions are studied in d-dimensional systems with quenched random impurities and general interactions. New but more universal singular behavior is predicted: e.g., under random fields the wetting-layer thickness at complete wetting should diverge as h^-1/2 for d=3, where h measures the deviation from the bulk-phase boundary. Wetting exponents are expressed in terms of a single spatial anisotropy or roughness exponent, {ζ}, defined via ξ_⊥{~}ξ?^ζ where ξ_⊥ and ξ? are the wetting correlation lengths.
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Lipowsky et al. (1986) studied this question.
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