Answers are grounded in this paper and cite their sources.
In 2009, a crystalline oxide semiconductor with a layered structure, which we refer to as c ‐axis–aligned crystalline indium‐gallium‐zinc oxide ( CAAC ‐ IGZO ), was first discovered. CAAC ‐ IGZO has a peculiar crystal structure in which clear grain boundaries are not observed despite high c ‐axis alignment and absence of a ‐ b plane alignment. When compared to a Si field‐effect transistor ( FET ), a metal‐oxide‐semiconductor ( MOS ) FET , utilizing CAAC ‐ IGZO , presents lower off‐state current (on the order of yA [10 −24 A]). These unique characteristics allow CAAC ‐ IGZO to realize devices with low power consumption. With the emerging era of artificial intelligence, wherein power saving becomes more significant, CAAC ‐ IGZO has attracted attention as a potential replacement for Si. This paper describes the characteristics and potentials of CAAC ‐ IGZO for the development of memory devices with unprecedented functions.
No takes yet. Share an insight, caveat, or question.
Yamazaki et al. (2019) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: