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Magnetic force microscopy offers an inexpensive means of measuring magnetic microstructure with high spatial resolution by scanning a magnetized tip across the surface of a magnetic sample. Contrast in the magnetic force microscope is a complicated function of the magnetic fields emanating both from the tip and the sample under observation. Electron holographic methods were used in order to quantitatively determine the fields in proximity to extremely small magnetic force microscope tips.
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Streblechenko et al. (1996) studied this question.
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