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A systematic study of solution‐grown polyethylene crystals in the electron microscope using dark‐field imaging in several diffracted beams has warranted a detailed analysis of the moiré patterns recorded. Direct proof for the existence of tilt moiré patterns has been obtained for the first time, while parallel and tilt patterns have been positively distinguished. Consideration of the formation conditions and properties of moiré patterns in dark field has been extended to include interference between an electron beam diffracted in both participating crystals with one diffracted in only one of them. Examples of moiré patterns depending thus on double diffraction have been identified.
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John R. White (1974) studied this question.
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