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A new high-pressure energy-dispersive x-ray diffraction apparatus is described. Two major features distinguish this system from previous ones: the ability to collect diffraction data from small sample areas subjected to pressures over 1 Mbar and to scan across the sample. This system also has the ability to calibrate the diffraction angle without making any assumptions about the lattice spacings of the sample.
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Brister et al. (1986) studied this question.
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