The relationship between interfacial chemical states and resistance-switching (RS) behaviors at the metal/Pr0.7Ca0.3MnO3 (PCMO) interfaces has been studied by photoemission spectroscopy and x-ray absorption spectroscopy. For Al/PCMO interfaces that exhibit RS behavior, redox reactions between Al and Mn ions occur at the interface. In sharp contrast, no chemical reactions occur at Pt/PCMO interfaces that do not exhibit RS behavior. These results strongly suggest that the interfacial transition layer due to the redox reactions is responsible for the RS behavior at metal/PCMO interfaces.
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Yasuhara et al. (2010) studied this question.
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