Answers are grounded in this paper and cite their sources.
In this study, a grazing-incidence X-ray scattering (GIXS) formula was derived for lamellar structures formed in thin films supported on substrates, and a comprehensive numerical analysis was performed using the scattering formula. A quantitative analysis was conducted of lamellar structures formed in nanometre-scaled thin films of a brush polymer, poly[oxy( n -decylthiomethylenyl)ethylene], supported on silicon substrates, by GIXS measurements during cooling and subsequent heating, and data analysis was performed using the scattering formula. This analysis provided details (long period, sub-layers and their thicknesses, volume fraction, bristle paracrystal distortion factor, and orientation) of the lamellar structure with varying temperature that are not easily obtained using conventional techniques. Moreover, a molecular structure model and electron density profiles were established.
No takes yet. Share an insight, caveat, or question.
Yoon et al. (2007) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: