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The Ca:P ratio in a certified standard of hydroxyapatite was determined by X‐ray spectrometry (XRS), with the X‐rays excited by both electrons and ions using energy dispersive spectroscopy on the scanning electron microscope (SEM‐EDS) and particle‐induced X‐ray emission (PIXE). The certified value of Ca:P was accurately verified by 3 MeV 4 He + Rutherford Backscattering Spectrometry (RBS). We show that the demonstrably rough surface of this sample does not cause perturbation of the Ca:P ratio within the uncertainties of each of the XRS measurements.
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Bailey et al. (2009) studied this question.
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