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The effect of a buffer layer on a (GaAl)As double-heterostructure wafer is examined by a photoluminescence (PL) technique. It is found that a buffer layer improves the radiative efficiency and lasing characteristics. There exists a good correlation between the buffer-layer thickness, and the PL intensity of an active layer and the threshold current density.
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Shima et al. (1980) studied this question.
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