We study the behavior of nanometer size particulates at a liquid-vapor interface by means of molecular dynamics simulations. We propose a methodology for computing the line tension using computer simulations, and present new data for the wetting of particulates at a planar liquid-vapor interface, as a function of particulate size. For the sizes considered in this work the line tension is negative and influences the wetting behavior of particulates at the liquid-vapor interface.
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Bresme et al. (1998) studied this question.