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October 15, 1979Physical Review Letters

Small-Angle-Scattering Evidence of Voids in Hydrogenated Amorphous Silicon

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PDPeter D’AntonioBiocon (Switzerland)JKJ. H. KonnertUnited States Naval Research Laboratory

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D’Antonio et al. (1979) studied this question.

synapsesocial.com/papers/6a82dd2cc40fc255ce134727https://doi.org/10.1103/physrevlett.43.1161
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Also Consider

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  1. 1Small-Angle Scattering of X-Rays1956 · 3,868 citations
  2. 2Photoluminescence of hydrogenated amorphous silicon1977 · 85 citations
  3. 3The Preparation and Properties of Amorphous Silicon1969 · 495 citations