Direct Observation of HPL and DG Structure in PS-b-PI Thin Film by Transmission Electron Microscopy

ADVERTISEMENT RETURN TO ISSUEPREVNoteNEXTDirect Observation of HPL and DG Structure in PS-b-PI Thin Film by Transmission Electron MicroscopyHae-Woong Park, Kyuhyun Im, Bonghoon Chung, Moonhor Ree, Taihyun Chang, Koji Sawa, and Hiroshi JinnaiView Author Information Department of Chemistry and Polymer Research Institute, Pohang University of Science and Technology, Pohang 790-784, Korea Department of Macromolecular Science and Engineering, Graduate School of Science and Engineering, Kyoto Institute of Technology, Kyoto 606-8585, Japan Cite this: Macromolecules 2007, 40, 7, 2603–2605Publication Date (Web):March 7, 2007Publication History Received10 December 2006Revised8 February 2007Published online7 March 2007Published inissue 1 April 2007https://pubs.acs.org/doi/10.1021/ma062826chttps://doi.org/10.1021/ma062826cbrief-reportACS PublicationsCopyright © 2007 American Chemical SocietyRequest reuse permissionsArticle Views962Altmetric-Citations43LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose SUBJECTS:Chemical structure,Layers,Phase transitions,Thin films,Transmission electron microscopy Get e-Alerts