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Reflectance of thin gallium films in the spectral range 0.3-0.9 mu m is measured for several temperatures around the melting point. When melting occurs, the reflectance increases considerably in the whole spectral range (about 20% at 0.6 mu m). A free-electron model is assumed; this is found to be in good agreement with experiments on liquid-phase systems. A qualitative interpretation is proposed and is found to explain the considerable change occurring during melting.
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Kofman et al. (1979) studied this question.
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