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July 22, 2005NanotechnologyOpen Access

A new method for characterizing nonlinearity in scanning probe microscopes using digital image correlation

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Authors

HJH. JinSandia National LaboratoriesHBHugh A. BruckUniversity of Maryland, College Park

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Jin et al. (2005) studied this question.

synapsesocial.com/papers/6a831f3428b8a62be9990608https://doi.org/10.1088/0957-4484/16/9/072
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