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A method is described which complements present techniques and enables measurements to be made of the secondary electron emission coefficient, γ, for ions on materials for which γ is difficult or impossible to measure by the "flashing" or heating technique. The method allows operation in a high-vacuum (10^-8 Torr) system as opposed to an ultra-high vacuum (10^-9 Torr) system. Results for the secondary electron emission coefficient, γ, are presented for Ar⁺ on Zr, Cu, Mo, Ni, Ta, and Al, and for Ne⁺, Kr⁺, and Xe⁺ on Cu and Mo in the energy range 0.5 to 10.0 keV. Comparisons with present theories and with other experimental results are made.
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Magnuson et al. (1963) studied this question.
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