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Time-of-flight (TOF) measurements are conducted in annealed (50°C) Langmuir-Blodgett (LB) films of chemically prepared regioregular 33.5% undoped poly(3-hexylthiophene) (P3HT) mixed with 66.5% stearic acid. The characterization of these poly(3-hexylthiophene)-stearic acid (P3HT-SA) films is accomplished using scanning electron microscopy (SEM), atomic force microscopy (AFM) and UV-visible analyses. The value of the TOF photocarrier mobility obtained in P3HT-SA LB film sandwiched between metal (Al) and indium-tin-oxide (ITO) glass is experimentally determined as 1.8×10 -5 cm 2 /Vs at an applied field of 1.3×10 6 V/cm.
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Malhotra et al. (1999) studied this question.
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