Experimental study demonstrates energy-filtered convergent-beam RHEED on silicon surfaces, indicating that energy filtering is necessary for quantitative surface potential analysis.
Towards the goal of recording and analysing the elastically filtered intensity of 4–50 keV electrons within the two-dimensional reflection rocking curves (convergent-beam RHEED patterns), preliminary experiments with a one-dimensional serial energy filter have been performed. Zero-loss and plasmon-loss filtered linescans through the specular disc of a CB-RHEED pattern from the Si(001)-2 × 1 surface at 4 kV are shown and compared with dynamical calculations. Energy-filtered detection of CB-RHEED patterns is necessary for quantitative analysis of the surface potential.
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Weierstall et al. (2001) studied this question.
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