A method for the evaluation of the two-dimensional MTF of x-ray systems is described. In a first step a statistical distribution of lead grains is imaged by the x-ray systems. In the second step this image is Fourier transformed in a coherent optical processor giving the two-dimensional display of the MTF. A demonstration of the method is given by showing the dependence of the MTF on shape and size of the focal spot of the x-ray tube and the nonshift invariance of a system using a rotating anode tube. Furthermore the application of the method in tomographic x-ray systems is tested.
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Groh et al. (1973) studied this question.
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