This paper reports the first total dose tests on a nanocrystalline diamond lateral vacuum field emission microelectronics (VFEM) technology. This technology operates efficiently at both low and high temperatures (200degC) and is inherently ldquohardrdquo to radiation. No measurable change in device response is observed after 15 Mrad(SiO2) total dose exposure, signifying an emerging electronics for extreme environment.
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Kang et al. (2007) studied this question.
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