Answers are grounded in this paper and cite their sources.
A methodological approach for advanced facet temperature characterization of operating diode lasers is presented. It relies on the concerted application of micro-Raman spectroscopy and thermoreflectance mapping. The latter technique allows for fast facet mapping, whereas the Raman data provide the temperature calibration. Residual effects, e.g., caused by the different reflectances of the materials involved into the laser structure, are discussed. Since both techniques provide rather complementary information, their concerted application appears as an effective tool for advanced device inspection.
No takes yet. Share an insight, caveat, or question.
Ochalski et al. (2006) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: