The life expressions of models of insulation aging are functions of temperature and field as well as material parameters. A methodology is presented that allows these models to be applied to a cable geometry in which there is a radial variation of both field and temperature. In this way material parameters can be extracted from cable data. The methodology is illustrated using one such model and the parameters deduced from cable failure distributions are compared with those obtained for thin films. This comparison allows conclusions to be drawn about how the aging process affects specimens of the same material with different volumes
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Cooper et al. (2005) studied this question.
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