Using the pump-probe technique with laser noise compensation, laser picosecond acoustic measurements were carried out for the amorphous sputtered thin films a-Ge and a-InSb on sapphire substrates with both pump and probe beams incident on the front side of the film. The contraints at the stress generation region were then changed using a pump beam incident on the substrate side of the a-Ge film, allowing background signals from non-acoustic sources to be greatly reduced. The symmetry of the detected echo pulse shapes are interpreted with a theoretical model.
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Wright et al. (1991) studied this question.
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