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The electrodynamic phenomenon of void resonance is used to interpret anomalous structure reported by Donovan and co-workers in the uv dielectric constants of evaporated amorphous germanium. The resulting void parameters are consistent with the existence of a connected network of microcracks perhaps 6 {} in width, separating much larger islands of void-free material. The origin and consequences of these fissures are discussed, including the expectation that several film properties are anisotropic.
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F. L. Galeener (1971) studied this question.
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