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The heteroepitaxial growth of (111) CdTe on (100) GaAs substrates has been obtained by laser assisted deposition at 350 °C. Films 5–14 μm thick were characterized by x-ray diffraction, UV reflectance measurement, and transmission electron microscopy. Results indicate good crystallinity with 105 cm−2 dislocation densities beyond a few microns from the CdTe/GaAs interface.
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Cheung et al. (1983) studied this question.
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