Extended x-ray absorption fine structure (EXAFS) measurements have been made while simultaneously exciting x-ray standing waves in a multilayer structure. This allows the EXAFS signal from selected regions within the multilayer unit cell to be enhanced. The technique is applied to a Ni-Ti multilayer in which it is verified that strong standing-wave fields can be excited in the presence of substantial interfacial roughness. The measurements reveal little Ni-Ti intermixing and a strong low-Z impurity signal in the Ti layers. The standing-wave analysis indicates that the low-Z impurity is distributed throughout the Ti layers.
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Heald et al. (1989) studied this question.
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