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April 7, 2003Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Electrical properties of aluminum oxide films deposited on indium-tin-oxide glasses

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Authors

JLJiyoul LeeSt. Mary's HospitalSKS. S. KimSISeongil ImYonsei University

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Lee et al. (2003) studied this question.

synapsesocial.com/papers/6a8468e8d87e21f83cb29de0https://doi.org/10.1116/1.1565344
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