Microstructural evolution with the change in thickness of superconducting YBa2Cu3O7-Xfilms on single-crystal SrTiO3substrates deposited by pulsed laser deposition was evaluated using different structural characterization tools. A noticeable degradation of crystallinity with the increased film thickness was detected. Nevertheless, a comprehensive relationship between the microstructure and the zero-field current-density can not be established solely based on the degradation of crystallinity.
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Jia et al. (2007) studied this question.
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