We investigate the impact of the deposition of low work function metals such as calcium on thin layers of fluorene-type polymers by time-of-flight secondary ion mass spectroscopy. An implantation process rather than a slow metal diffusion is found to be the most probable source of metal contamination within the polymer layers. This contamination extends to a range of several tens of nanometers in the organic layers. Photoluminescence and electroluminescence measurements are performed with varying calcium layer thicknesses. The luminescence efficiency exhibits a strong correlation with the depth profile of the calcium present within the polymer. The results are discussed with respect to the exciton diffusion length in the fluorene polymer. A numerical model including exciton formation, migration, and quenching is proposed in order to describe the observed phenomena.
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Stoessel et al. (2000) studied this question.
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