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A method for identifying scattering parameters of launchers and uniform microstrips is presented. It is shown that 8 complex measurements (magnitude and phase) on two microstrips which are different only in length, inserted between two launchers, can give, with suitable algebraic treatment, the S-parameters of either the microstrips and the launchers. This technique is promising for deembedding active devices as well for microstrip discontinuities.
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Bianco et al. (1976) studied this question.
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