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The apparatus and techniques for displaying both rotational critical curves and rotational hysteresis curves are described. The use of large values of 20-kc control fields and linear circuitry enables the oscilloscope display of these curves to be directly related to the rotation of thin-film magnetization. The degree of deviation of switching properties of actual magnetic films from those of the theoretical model can conveniently be determined from the oscilloscope display.
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Jeffrey Smith (1962) studied this question.
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