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April 1, 1973Review of Scientific Instruments

Fast, Accurate Secondary-Electron Yield Measurements at Low Primary Energies

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VHVictor E. HenrichYale University

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Victor E. Henrich (1973) studied this question.

synapsesocial.com/papers/6a8520dd4b2893ddcbc6ad40https://doi.org/10.1063/1.1686155
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