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November 1, 1967IEEE Transactions on Electron Devices

On the determination of minority carrier lifetime from the transient response of an MOS capacitor

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FHF.P. HeimanBrunswick (United States)

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F.P. Heiman (1967) studied this question.

synapsesocial.com/papers/6a85226832b8a2b0ded69e7dhttps://doi.org/10.1109/t-ed.1967.16107
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